Such orientation/phase maps may be produced very fast, making the technique highly attractive for high throughput TEM based orientation imaging analysis. A TEM precession interface may perform a scanning through a sample area (typical area 5×5 μm2), collecting a large number of PED patterns which are compared one by one by cross-correlation techniques with a series of generated diffraction patterns (templates) of all possible orientations of known phases existing on the sample scanned area. Precession diffraction based applications have been developed for TEM based phase and orientation maps for nanocrystal (EBSDSEM like). Precession electron diffraction (PED) in TEM is an emerging technique, using electron diffraction patterns collection very close to kinematical condition (like in x-ray diffraction), useful in solving ab-initio crystal structures of nanocrystals. Novel TEM applications with precession electron diffraction: orientation imaging at nm scale, strain analysis, and solving structures ab-initioġ1:00 a.m.-12:15 p.m., Tuesday, July 24, 2018
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